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D8 integrating sphere reflector

D8 integrating sphere reflector

 

 

 

rt3000 standard 8 degree angle reflectometer
manual pulling is convenient, fast, and accurate in positioning
product presentation
in the field of solar cell manufacturing, obtaining the reflectivity of solar silicon wafers is of great significance to production control and research. jingyi optoelectronics designed the rt3000 integrating sphere reflectometer according to iso7724 and din5033 standards. the single-point test time is only 1 second to complete, which helps customers control the quality of solar cells and improves the detection efficiency. with many years of experience in designing spectral testing instruments, jingyi optoelectronics' rt3000 series standard 8-degree angle integrating reflectometer has become the standard testing equipment for quality control of the texturing and coating links in the solar photovoltaic industry.
product features
manual pull-out, convenient and fast, accurate positioning;
national standard design, high precision;
integrating sphere, non-contact;
ultra-long life light source;
reasonable structural design, easy maintenance;
chromaticity value rgb, xyz, lab;
millisecond-level measurement, fast testing speed;
simple and convenient software operation;
application areas
solar photovoltaic industry
polishing
testing the reflectivity of polished sheets
acid/alkali textile making
test the reflectivity after velveting
pecvd coating
testing the effect of silicon carbide coating
technical parameters
model
rt3000-uv
rt3000-vis
rt3000-nir
wavelength range
360-1050nm
400-1000nm
400-2500nm
sample size
156mm x 156mm piece 125mm x 125mm piece
156mm x 156mm piece 125mm x 125mm piece
156mm x 156mm piece 125mm x 125mm piece
reflectivity range
0-100%
0-100%
0-100%
reflectivity accuracy
0.05%
0.05%
0.05%
single point measurement time
1 second
1 second
1 second
color measurement
measurement spot diameter
10mm
10mm
10mm
measurement mode
dual optical path integrating sphere
dual optical path integrating sphere
dual optical path integrating sphere
integrating sphere reflectivity
99%
99%
99%
lamp life
10000 hr
10000 hr
10000 hr
measurement standard
iso7724、din5033
iso7724、din5033
iso7724、din5033
if you need to measure the reflectivity of multiple points on the cell surface, please purchase the rt3000-stm fully automatic standard 8-degree angle integrating reflectometer.
configuration instructions
model
description
host
standard 8-degree integrating reflectometer
software
rt3000 operating software
calibration board
standard whiteboard(data can be traced back to the chinese academy of metrology)

 

Fully automatic standard 8 degree angle reflectometer

Support fully automatic 2D scanning

Product Presentation

In the field of solar cell manufacturing, obtaining the reflectivity of solar silicon wafers is extremely important for production control and research. Jingyi Optoelectronics designed the RT3000-STM fully automatic integrating sphere reflectometer according to ISO7724 and DIN5033 standards.
Multi-point automatic testing, Mapping function, automatic calculation of multi-point average reflectivity, maximum and minimum reflectivity, etc., provide customers with effective testing solutions for quality control of solar cells and improving testing efficiency. With many years of experience in designing spectral testing instruments, Jingyi Optoelectronics' RT3000-STM series standard 8-degree angle integrating reflectometer has become the standard testing equipment for quality control of the texturing and coating links in the solar photovoltaic industry.

Product Features

Supports fully automatic two-dimensional scanning (Mapping)
Automatic positioning, convenient and fast
Automatic calculation of average, minimum and maximum values;
National standard design, high precision;
Integrating sphere, non-contact;
Ultra-long life light source;
Reasonable structural design, easy maintenance;
Chromaticity value RGB, XYZ, Lab;
Millisecond-level measurement, fast test speed;
Simple and convenient software operation;

Application Areas

Solar photovoltaic industry
Polishing
Testing the reflectivity of polished sheets
Acid/Alkali Textile Making
Test the reflectivity after velveting
PECVD coating
Testing the effect of silicon carbide coating

Technical Parameters

Model
RT3000-UV-STM
RT3000-VIS-STM
RT3000-NIR-STM
Wavelength range
350-1050nm
400-1000nm
400-2500nm
Sample size
182 X 182 mm<br>Compatible with 210, 230 sizes
156 mm X 156 mm piece<br>125 mm X 125 mm piece
156 mm X 156 mm piece<br>125 mm X 125 mm piece
Reflectivity range
0-100%
0-100%
0-100%
Reflectivity accuracy
0.05%
0.05%
0.05%
Single point measurement time
1 second
1 second
1 second
Automatic 2D scanning (Mapping)
Automatically locate any point
Automatically locate any point
Automatically locate any point
Color measurement
Measurement spot diameter
10mm
10mm
10mm
Measurement mode
Dual optical path integrating sphere
Dual optical path integrating sphere
Dual optical path integrating sphere
Integrating sphere reflectivity
99%
99%
99%
Lamp life
10000 hr
10000 hr
10000 hr
Measurement standard
ISO7724, DIN5033
ISO7724, DIN5033
ISO7724, DIN5033

Configuration Description

Model
Description
Host
Standard 8-degree angle integrating reflectometer
Software
RT3000-STM operating software
Calibration board
Standard whiteboard (data can be traced back to the Chinese Academy of Science and Metrology)
Workbench
Desktop work platform
Computer
Industrial computer