均匀扩展型光谱可调光源：从可见光到近红外波段的光谱模拟
JY-iphS-E
JY-iphS-E spectrally tunable uniform extended light source achieves the simulation of various spectral distributions from visible to near-infrared bands by mixing more than 30 kinds of monochromatic LEDs and halogen tungsten light sources (or xenon light sources) in an integrating sphere, such as CIEA light source, B light source, C light source, D65 light source, E light source, grassland spectrum, forest spectrum, desert spectrum and seawater spectrum, etc., to obtain a uniform radiation light source with arbitrarily tunable spectrum. The spectral radiation monitor based on the spectrometer can display and control the output spectral radiation brightness in real time, and the software will also display the matching error between the output simulation spectrum and the target spectrum in real time. The unit probe based on the unit detector is used to detect the stability of the system output.
Product advantages Full-band integrated radiant brightness can reach 120W/(m²sr)@ (400nm~900nm) Output spectral distribution can be tuned and color adjusted to achieve spectral radiant output close to real scenes Same color, same spectrum and wide color gamut simulation based on monochromatic LED can be used for color calibration of optical remote sensors High-stability radiant brightness output of 0.5%/2h to meet the needs of long-term high-stability calibration process 98% radiant illumination uniformity and 98% angular (Lambertian) uniformity provide high-quality Lambertian surface light source Calibration can be traced back to the National Institute of Metrology (NIM) of China and provide metrological calibration report Software implements monitoring, outputs spectral radiant brightness and chromaticity information
Technical parameters
|
Indicators
|
Technical parameters
|
|
Light outlet size (mm)
|
Φ150 (customizable)
|
|
Light source
|
34 kinds of monochromatic LED, halogen lamp (or xenon lamp light source)
|
|
Spectral range (nm)
|
400~1000
|
|
Maximum integrated radiant brightness (W/m²/sr)
|
>120
|
|
Spectral error
|
Spectral matching error <5% (P-V value)
|
|
Surface uniformity
|
Better than 98%
|
|
Instability
|
<0.5%/2h
|
|
Monitoring spectrometer spectral range (nm)
|
400~1000
|
|
Unit detector
|
Si detector
|
|
Spectral database
|
100 kinds (expandable)
|
|
Working environment
|
Temperature: 20℃~40℃, humidity: 20%~80%
|
|
Software
|
Developed based on Labview environment
|
|
Computer interface
|
Network port and USB port
|
