Jingyi Optoelectronics RT3000-STM Fully Automatic Integrating Sphere Reflectometer Product Presentation
Fully automatic standard 8 degree angle reflectometer
Support fully automatic 2D scanning
Product Presentation
In the field of solar cell manufacturing, obtaining the reflectivity of solar silicon wafers is extremely important for production control and research. Jingyi Optoelectronics designed the RT3000-STM fully automatic integrating sphere reflectometer according to ISO7724 and DIN5033 standards.
Multi-point automatic testing, Mapping function, automatic calculation of multi-point average reflectivity, maximum and minimum reflectivity, etc., provide customers with effective testing solutions for quality control of solar cells and improving testing efficiency. With many years of experience in designing spectral testing instruments, Jingyi Optoelectronics' RT3000-STM series standard 8-degree angle integrating reflectometer has become the standard testing equipment for quality control of the texturing and coating links in the solar photovoltaic industry.
Product Features
Supports fully automatic two-dimensional scanning (Mapping)
Automatic positioning, convenient and fast
Automatic calculation of average, minimum and maximum values
National standard design, high precision
Integrating sphere, non-contact
Ultra-long life light source
Reasonable structural design, easy maintenance
Chromaticity value RGB, XYZ, Lab
Millisecond-level measurement, fast test speed
Simple and convenient software operation
Application Areas
Solar photovoltaic industry
Polishing
Testing the reflectivity of polished sheets
Acid/Alkali Textile Making
Test the reflectivity after velveting
PECVD coating
Testing the effect of silicon carbide coating
Technical Parameters
|
Item
|
RT3000-UV-STM
|
RT3000-VIS-STM
|
RT3000-NIR-S TM
|
|
Model
|
RT3000-UV-STM
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RT3000-VIS-STM
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RT3000-NIR-S TM
|
|
Wavelength range
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350-1050nm
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400-1000nm
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400-2500nm
|
|
Sample size
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182 X 182 mm<br>Compatible with 210, 230 sizes
|
156 mm X 156 mm piece<br>125 mm X 125 mm piece
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156 mm X 156 mm piece<br>125 mm X 125 mm piece
|
|
Reflectivity range
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0-100%
|
0-100%
|
0-100%
|
|
Reflectivity accuracy
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0.05%
|
0.05%
|
0.05%
|
|
Single point measurement time
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1 second
|
1 second
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1 second
|
|
Automatic 2D scanning (Mapping)
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Automatically locate any point
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Automatically locate any point
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Automatically locate any point
|
|
Color measurement
|
√
|
√
|
√
|
|
Measurement spot diameter
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10mm
|
10mm
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10mm
|
|
Measurement mode
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Dual optical path integrating sphere
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Dual optical path integrating sphere
|
Dual optical path integrating sphere
|
|
Integrating sphere reflectivity
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99%
|
99%
|
99%
|
|
Lamp life
|
10000 hr
|
10000 hr
|
10000 hr
|
|
Measurement standard
|
ISO7724、DIN5033
|
ISO7724、DIN5033
|
ISO7724、DIN5033
|
配置说明
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Model
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Description
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|
Host
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Standard 8-degree angle integrating reflectometer
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|
Software
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RT3000-STM operating software
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|
Calibration board
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Standard whiteboard (data can be traced back to the Chinese Academy of Science and Metrology)
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|
Workbench
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Desktop work platform
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|
Computer
|
Industrial computer
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