Jy-F02 Reflectance Detector: Fast and easy to operate for measurement
Reflectance detector jy-f02
Short measurement time, easy operation, flexible use
Product Introduction
The JY-F02 reflectivity detection system produced by Jingyi Optoelectronics adopts an integrating sphere 8 ° angle testing method, which can be used to measure the reflectivity, reflection color, and composition information of objects in chemical samples. It is designed to implement international and national standards for chemical industries such as coatings, pigments, inks, flat samples, silicon chips, coated surfaces, mirror aluminum mirrors, paints, plastics, fabrics, etc iso 2814、iso 3905、iso 3906、iso 6504-1、iso7724、gb/t 5211.17、gb/t 9270、gb/t 23981、gb/t 13452、gb5211、din5033、bsi 13900-d4、astm 97、1347、d4212、iso 6719:2010 A specialized instrument developed according to standards, which fully complies with national standards.
Product Features
1. Short measurement time, with a single test time of less than 1 second
2. Integral ball test, stable test
3. Patent technology products
4. Third party authoritative testing certificate
5. Test wavelength range: 250-800nm, 400-1000nm, 900-1700nm (special wavelengths can be customized)
6. Using halogen lamp light source or deuterium tungsten lamp light source, the light source output is uniform and stable
7. Support xy chromaticity diagram and l · a · b measurement, which can be used to determine object color based on spectral reflectance using spectrophotometry
8. Easy to operate and flexible to use
9. Lifetime warranty for instruments
10. Customizable industrial online automatic detection solution
Application Fields
1. Measurement of reflectance spectra and color sorting of coatings, pigments, inks, plastics, and other materials.
2. Solid reflectance spectroscopy measurement
3. Measurement of powder reflectance spectra
4. Measurement of reflectivity of non reflective thin films
5. Reflectance measurement
6. Reflectance detection of optical components
7. Fluorescent powder detection
8. Solar silicon wafer testing
9. Fabric measurement
10. Biochemical process monitoring
11. Biometric measurement
12. Chemical analysis and identification
Product Specifications
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project
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jy-f02-uv
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jy-f02-vis
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jy-f02-nir
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model
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jy-f02-uv
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jy-f02-vis
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jy-f02-nir
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wavelength range
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250-800nm
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400-1000nm
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900-1700nm
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Sample mouth
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5mm
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9.5mm
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5mm
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fiber length
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Standard 0.5m
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Standard 0.5m
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Standard 0.5m
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Standard Whiteboard
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Standard 27mm
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Standard 27mm
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Standard 27mm
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Reflectance measurement range
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0-100%
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0-100%
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0-100%
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Measure wavelength interval
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1nm
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1nm
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1nm
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Single sampling time
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Better than 2s
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Better than 1 second
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Better than 10 seconds
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Reflectivity accuracy
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Better than 1%
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Better than 1%
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Better than 1%
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Test repeatability
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Better than 1%
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Better than 1%
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Better than 1%
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Reflectivity of Integral Sphere Coating
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>98%
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>98%
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>98%
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Deducting dark background
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Automatic
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Automatic
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Automatic
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light source lifetime
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2000 hours
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2000 hours
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2000 hours
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Measurable parameters
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Wavelength reflectance, average reflectance, reflectance spectral curve, reflectance over time curve, etc
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Wavelength reflectance, average reflectance, reflectance spectral curve, reflectance over time curve, reflectance colors xy, xyz, lab, etc
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Wavelength reflectance, average reflectance, reflectance spectral curve, reflectance over time curve, material spectral composition analysis, etc
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Computer operating system
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USB interface<br>supports operating systems:windows98/2000/xp/vista/windows7/8/10
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USB interface<br>supports operating systems:windows98/2000/xp/vista/windows7/8/10
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USB interface<br>supports operating systems:windows98/2000/xp/vista/windows7/8/10
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Component Details
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UV spectrometer x1; UV fiber x2; standard whiteboard x1; deuterium halogen light source x1; integrating sphere+bracket x1; testing software x1
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Universal spectrometer x1; Universal fiber x2; Standard whiteboard x1; Halogen light source x1; Integrating sphere+bracket x1; Testing software x1
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Near infrared spectrometer x1; Near infrared fiber x2; Standard whiteboard x1; Halogen light source x1; Integrating sphere+bracket x1; Testing software x1
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