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Integrating sphere spectral power measurement

Integrating sphere spectral power measurement

 

 

 

 

 

 

Product Presentation
Jingyi Optoelectronics' integrating sphere spectrum power test system ensures that calibrated or divergent lasers or laser diodes are measured in an accurate and reproducible way. The components use high-quality PTFE high diffuse reflectance material integrating sphere to collect the light source. The unique geometric structure of the integrating sphere design makes the laser beam power measurement unaffected by the polarization and calibration of the laser beam, and can accurately measure the spectrum and power of the light source. The power and wavelength of the light source are measured respectively by the optical power meter and the fiber optic spectrometer, and the measurement results are output through professional software. For some special applications, we can attenuate by adding attenuation plates. Professional software is used to simultaneously analyze the real-time situation of wavelength and power. The calibration of the system can be traced back to the National Institute of Standards and Technology (NIST).
Features
  • Factory traceability calibration: Ensures measurement accuracy and reliability with traceable calibration standards.
  • Integrating sphere and optical power sensor are calibrated together: Enhances measurement consistency and accuracy.
  • Dedicated software can obtain spectrum and optical power data with one click: Simplifies operation and improves efficiency.
  • Capable of accurately and effectively collecting the power of highly divergent light sources: Suitable for a wide range of laser types.
  • Fast measurement speed, can be used for online real-time detection: Ideal for dynamic monitoring and industrial applications.
Laser for UV-Vis-NIR Band
Parameter JYLPM-50-US JYLPM-84-US JYLPM-100-US JYLPM-125-US JYLPM-150-US
Wavelength Range 200–1100nm 200–1100nm 200–1100nm 200–1100nm 200–1100nm
Wavelength Accuracy ≤0.5nm ≤0.5nm ≤0.5nm ≤0.5nm ≤0.5nm
Spectrometer Resolution 0.1nm–1nm 0.1nm–1nm 0.1nm–1nm 0.1nm–1nm 0.1nm–1nm
Measurement Time 0.2ms 0.2ms 0.2ms 0.2ms 0.2ms
Integrating Sphere Coating PTFE PTFE PTFE PTFE PTFE
Integrating Sphere Diameter 50mm 84mm 100mm 125mm 150mm
Detection Aperture 13mm 25.4mm 25.4mm 25.4mm 25.4mm
Low Power Laser 1nw–0.01w 1nw–0.01w 1nw–0.01w 1nw–0.01w 1nw–0.01w
Medium Power Laser 100nw–1w 100nw–1w 100nw–1w 100nw–1w 100nw–1w
High Power Laser 10mw–100w 10mw–100w 10mw–100w 10mw–100w 10mw–100w
Linearity ±0.5% ±0.5% ±0.5% ±0.5% ±0.5%
Uniformity ±2% ±2% ±2% ±2% ±2%
Power Meter Probe Material Si-UV Si-UV Si-UV Si-UV Si-UV
Power Probe Traceability Calibration NIST NIST NIST NIST NIST
Communication Interface USB2.0 USB2.0 USB2.0 USB2.0 USB2.0
Operating Temperature 5°C–50°C 5°C–50°C 5°C–50°C 5°C–50°C 5°C–50°C
Relative Humidity <70%RH <70%RH <70%RH <70%RH <70%RH
Lasers for the Visible-Near Infrared Range
Parameter JYLPM-50-VS JYLPM-84-VS JYLPM-100-VS JYLPM-125-VS JYLPM-150-VS
Wavelength Range 380–1100nm 380–1100nm 380–1100nm 380–1100nm 380–1100nm
Wavelength Accuracy ≤0.5nm ≤0.5nm ≤0.5nm ≤0.5nm ≤0.5nm
Spectrometer Resolution 0.1nm–1nm 0.1nm–1nm 0.1nm–1nm 0.1nm–1nm 0.1nm–1nm
Measurement Time 0.2ms 0.2ms 0.2ms 0.2ms 0.2ms
Integrating Sphere Coating PTFE PTFE PTFE PTFE PTFE
Integrating Sphere Diameter 50mm 84mm 100mm 125mm 150mm
Detection Aperture 13mm 25.4mm 25.4mm 25.4mm 25.4mm
Low Power Laser 1nw–0.01w 1nw–0.01w 1nw–0.01w 1nw–0.01w 1nw–0.01w
Medium Power Laser 100nw–1w 100nw–1w 100nw–1w 100nw–1w 100nw–1w
High Power Laser 10mw–100w 10mw–100w 10mw–100w 10mw–100w 10mw–100w
Uncertainty ±5% ±5% ±5% ±5% ±5%
Linearity ±0.5% ±0.5% ±0.5% ±0.5% ±0.5%
Uniformity ±2% ±2% ±2% ±2% ±2%
Power Meter Probe Material Si Si Si Si Si
Power Probe Traceability Calibration NIST NIST NIST NIST NIST
Communication Interface USB2.0 USB2.0 USB2.0 USB2.0 USB2.0
Operating Temperature 5°C–50°C 5°C–50°C 5°C–50°C 5°C–50°C 5°C–50°C
Relative Humidity <70%RH <70%RH <70%RH <70%RH <70%RH
Lasers for Near-Infrared Applications
Parameter JYLPM-50-IS JYLPM-84-IS JYLPM-100-IS JYLPM-125-IS JYLPM-150-IS
Wavelength Range 800–1650nm 800–1650nm 800–1650nm 800–1650nm 800–1650nm
Wavelength Accuracy ≤0.5nm ≤0.5nm ≤0.5nm ≤0.5nm ≤0.5nm
Spectrometer Resolution 4nm 4nm 4nm 4nm 4nm
Measurement Time 0.2ms 0.2ms 0.2ms 0.2ms 0.2ms
Integrating Sphere Coating PTFE PTFE PTFE PTFE PTFE
Integrating Sphere Diameter 50mm 84mm 100mm 125mm 150mm
Detection Aperture 13mm 25.4mm 25.4mm 25.4mm 25.4mm
Low Power Laser 1nw–0.01w 1nw–0.01w 1nw–0.01w 1nw–0.01w 1nw–0.01w
Medium Power Laser 100nw–1w 100nw–1w 100nw–1w 100nw–1w 100nw–1w
High Power Laser 10mw–100w 10mw–100w 10mw–100w 10mw–100w 10mw–100w
Linearity ±0.5% ±0.5% ±0.5% ±0.5% ±0.5%
Uniformity ±2% ±2% ±2% ±2% ±2%
Power Meter Probe Material InGaAs InGaAs InGaAs InGaAs InGaAs
Power Probe Traceability Calibration NIST NIST NIST NIST NIST
Communication Interface USB2.0 USB2.0 USB2.0 USB2.0 USB2.0
Operating Temperature 5°C–50°C 5°C–50°C 5°C–50°C 5°C–50°C 5°C–50°C
Relative Humidity <70%RH <70%RH <70%RH <70%RH <70%RH
Accessories
Standard Accessories:
  • Integrating Sphere
  • Spectrometer
  • Power Meter
  • Optical Fiber
  • Analysis and Testing Software
Optional Accessories:
  • Detector Front End Attenuator
Note: The actual testable power depends on the thermal limit of the coating or material inside the integrating sphere. For more information, please contact our technical sales staff.