Integral sphere spectral power testing system
JINGYI Jing Yi
Fast measurement speed, suitable for online real-time detection
Product Introduction
PRODUCT PRESENTATION
The Jingyi Optoelectronic Integrating Sphere Spectral Power Testing System ensures accurate and reproducible measurement of calibrated or divergent lasers or laser diodes. The components are made of high-quality PTFE high diffuse reflection material, and the integrating sphere collects the light source. The unique geometric structure of the integrating sphere design ensures that the measurement of laser beam power is not affected by laser beam polarization and calibration, and can accurately measure the spectrum and power of the light source. Measure the power and wavelength of the light source separately using an optical power meter and a fiber optic spectrometer, and output the measurement results through professional software. For some special applications, we can attenuate by adding attenuation plates. The calibration of this system can be traced back to the National Institute of Standards and Technology (NIST) by analyzing the real-time situation of wavelength and power through professional software.
Product Features
- Factory traceability calibration
- Calibration of integrating sphere and optical power probe together
- Specialized software allows for one click acquisition of spectral and optical power data
- Capable of accurately and effectively collecting the power of highly divergent light sources
- Fast measurement speed, suitable for online real-time detection
Product Application
- laser
- laser diode
- Laser diode component
- Divergent monochromatic light source
- Pulse laser power
Technical Parameters
Laser for UV Vis NIR band:
|
JYLPM-50-US |
JYLPM-84-US |
JYLPM-100-US |
JYLPM-125-US |
JYLPM-150-US |
| wavelength range |
200–1100nm |
200–1100nm |
200–1100nm |
200–1100nm |
200–1100nm |
| Wavelength accuracy |
≤0.5nm |
≤0.5nm |
≤0.5nm |
≤0.5nm |
≤0.5nm |
| Spectral resolution |
0.1nm–1nm |
0.1nm–1nm |
0.1nm–1nm |
0.1nm–1nm |
0.1nm–1nm |
| measure time |
0.2ms |
0.2ms |
0.2ms |
0.2ms |
0.2ms |
| Integral sphere coating |
PTFE |
PTFE |
PTFE |
PTFE |
PTFE |
| Integral sphere diameter |
50mm |
84mm |
100mm |
125mm |
150mm |
| Detection aperture |
13mm |
25.4mm |
25.4mm |
25.4mm |
25.4mm |
| Low power laser |
1nw–0.01w |
1nw–0.01w |
1nw–0.01w |
1nw–0.01w |
1nw–0.01w |
| Medium power laser |
100nw–1w |
100nw–1w |
100nw–1w |
100nw–1w |
100nw–1w |
| High power laser |
10mw–100w |
10mw–100w |
10mw–100w |
10mw–100w |
10mw–100w |
| linearity |
±0.5% |
±0.5% |
±0.5% |
±0.5% |
±0.5% |
| uniformity |
±2% |
±2% |
±2% |
±2% |
±2% |
| Power meter probe material |
Si–UV |
Si–UV |
Si–UV |
Si–UV |
Si–UV |
| Power probe traceability calibration |
NIST |
NIST |
NIST |
NIST |
NIST |
| communication interface |
USB2.0 |
USB2.0 |
USB2.0 |
USB2.0 |
USB2.0 |
| Operating Temperature |
5°C–50°C |
5°C–50°C |
5°C–50°C |
5°C–50°C |
5°C–50°C |
| relative humidity |
<70%RH |
<70%RH |
<70%RH |
<70%RH |
<70%RH |
Laser for visible near infrared band:
| parameter |
JYLPM-50-VS |
JYLPM-84-VS |
JYLPM-100-VS |
JYLPM-125-VS |
JYLPM-150-VS |
| wavelength range |
380–1100nm |
380–1100nm |
380–1100nm |
380–1100nm |
380–1100nm |
| Wavelength accuracy |
≤0.5nm |
≤0.5nm |
≤0.5nm |
≤0.5nm |
≤0.5nm |
| Spectral resolution |
0.1nm–1nm |
0.1nm–1nm |
0.1nm–1nm |
0.1nm–1nm |
0.1nm–1nm |
| measure time |
0.2ms |
0.2ms |
0.2ms |
0.2ms |
0.2ms |
| Integral sphere coating |
PTFE |
PTFE |
PTFE |
PTFE |
PTFE |
| Integral sphere diameter |
50mm |
84mm |
100mm |
125mm |
150mm |
| Detection aperture |
13mm |
25.4mm |
25.4mm |
25.4mm |
25.4mm |
| Low power laser |
1nw–0.01w |
1nw–0.01w |
1nw–0.01w |
1nw–0.01w |
1nw–0.01w |
| Medium power laser |
100nw–1w |
100nw–1w |
100nw–1w |
100nw–1w |
100nw–1w |
| High power laser |
10mw–100w |
10mw–100w |
10mw–100w |
10mw–100w |
10mw–100w |
| uncertainty |
±5% |
±5% |
±5% |
±5% |
±5% |
| linearity |
±0.5% |
±0.5% |
±0.5% |
±0.5% |
±0.5% |
| uniformity |
±2% |
±2% |
±2% |
±2% |
±2% |
| Power meter probe material |
Si |
Si |
Si |
Si |
Si |
| Power probe traceability calibration |
NIST |
NIST |
NIST |
NIST |
NIST |
| communication interface |
USB2.0 |
USB2.0 |
USB2.0 |
USB2.0 |
USB2.0 |
| Operating Temperature |
5°C–50°C |
5°C–50°C |
5°C–50°C |
5°C–50°C |
5°C–50°C |
| relative humidity |
<70%RH |
<70%RH |
<70%RH |
<70%RH |
<70%RH |
Laser for near-infrared band:
| parameter |
JYLPM-50-IS |
JYLPM-84-IS |
JYLPM-100-IS |
JYLPM-125-IS |
JYLPM-150-IS |
| wavelength range |
800–1650nm |
800–1650nm |
800–1650nm |
800–1650nm |
800–1650nm |
| Wavelength accuracy |
≤0.5nm |
≤0.5nm |
≤0.5nm |
≤0.5nm |
≤0.5nm |
| Spectral resolution |
4nm |
4nm |
4nm |
4nm |
4nm |
| measure time |
0.2ms |
0.2ms |
0.2ms |
0.2ms |
0.2ms |
| Integral sphere coating |
PTFE |
PTFE |
PTFE |
PTFE |
PTFE |
| Integral sphere diameter |
50mm |
84mm |
100mm |
125mm |
150mm |
| Detection aperture |
13mm |
25.4mm |
25.4mm |
25.4mm |
25.4mm |
| Low power laser |
1nw–0.01w |
1nw–0.01w |
1nw–0.01w |
1nw–0.01w |
1nw–0.01w |
| Medium power laser |
100nw–1w |
100nw–1w |
100nw–1w |
100nw–1w |
100nw–1w |
| High power laser |
10mw–100w |
10mw–100w |
10mw–100w |
10mw–100w |
10mw–100w |
| linearity |
±0.5% |
±0.5% |
±0.5% |
±0.5% |
±0.5% |
| uniformity |
±2% |
±2% |
±2% |
±2% |
±2% |
| Power meter probe material |
InGaAs |
InGaAs |
InGaAs |
InGaAs |
InGaAs |
| Power probe traceability calibration |
NIST |
NIST |
NIST |
NIST |
NIST |
| communication interface |
USB2.0 |
USB2.0 |
USB2.0 |
USB2.0 |
USB2.0 |
| Operating Temperature |
5°C–50°C |
5°C–50°C |
5°C–50°C |
5°C–50°C |
5°C–50°C |
| relative humidity |
<70%RH |
<70%RH |
<70%RH |
<70%RH |
<70%RH |
Product accessories
Standard accessories:
- integrating sphere
- spectrometer
- power meter
- Optical fiber
- Analysis and testing software
Optional accessories:
- Detector front-end attenuator