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Film thickness measuring instrumentBenefiting from the strong demand in application fields such as automotive electronics, industrial electronics, and the Internet of Things, there is a corresponding strong demand for chips and sensors, leading to an increase in demand for semiconductor silicon wafers. Coating is one of the important steps in preparing efficient crystalline silicon. In order to test the quality of silicon wafer coating, Jingyi Optoelectronics has developed products such as film thickness measuring instruments, semi-automatic film thickness measuring instruments, and online film thickness measuring instruments to improve factory production efficiency and product quality, and jointly promote the localization of semiconductor silicon wafers
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D8 ReflectometerIn the field of solar cell manufacturing, obtaining the reflectivity of solar silicon wafers is of great significance for production control and research. Jingyi Optoelectronics has developed the D8 reflectivity meter based on the characteristics of solar cells. The product is applied in the monitoring process of the cell velvet making process, providing customers with an effective detection solution for controlling the quality of solar cells and reducing losses
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Quality inspection scheme for semiconductor laser spotWith the development of lasers in medical, industrial production, laser printing, laser welding, laser communication and other application fields, the quality requirements for spot imaging size, shape, energy distribution and other aspects are becoming increasingly high. So the analysis and measurement of light spots is essential for improving the quality and performance of light spots. The spot quality analyzer developed by Jingyi Optoelectronics can be used to analyze the 2D/3D morphology, stable spot pointing, spot size, energy distribution, and other conditions of laser spots. Provide you with the most effective and valuable spot information to improve the quality of laser spot production
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Quality control of photovoltaic silicon wafers using contact angle measurementSolar energy is currently the fastest developing renewable energy source globally, and in order to ensure more effective and economical utilization of the photovoltaic effect, efforts are being made to further promote its development. Jingyi Optoelectronics uses the contact angle method to measure wettability, which is non-contact and non-destructive, leaving no trace on the surface after measurement. Therefore, it can be used for cleanliness production testing of photovoltaic silicon wafers, optimizing wafer fabrication and quality assurance
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Solution for photovoltaic glass transmittance detectorWith the accelerating global carbon neutrality process, coupled with the continuous decline in photovoltaic power generation costs and the continuous improvement of economic efficiency, the demand for high growth in the photovoltaic industry is highly certain. Photovoltaic glass is an essential material for photovoltaic modules, which directly affects the power generation efficiency and service life of photovoltaic modules. After coating, photovoltaic glass can ensure higher light transmittance, allowing solar cells to generate more electricity. The transmittance of photovoltaic glass directly affects the power generation efficiency of photovoltaic modules. The photovoltaic glass transmittance detector developed by Jingyi Optoelectronics can be used for non-contact online rapid detection of photovoltaic glass, improving the transmittance of photovoltaic glass and effectively enhancing the power generation efficiency of photovoltaic modules






















































































































































































































































































