This is the RT3000 standard 8-degree angle reflectometer, designed and manufactured by Jingyi Optoelectronics, specifically designed for the field of solar cell manufacturing. It achieves production quality control and process research by measuring the reflectivity of silicon wafers.
Product Core Information
- Design standards: Designed according to ISO7724 and DIN5033 international standards to ensure measurement authority.
- Testing efficiency: Single point testing only takes 1 second, greatly improving detection efficiency.
- Applicable process: Covering key processes such as polishing, acid alkali velvet production, PECVD coating, etc., it is a standard equipment for quality control of velvet production and coating in the photovoltaic industry.
Product Features
- Manual pulling structure, quick and accurate positioning;
- Integral sphere non-contact measurement to avoid sample damage;
- Support RGB, XYZ, LAB chromaticity value output;
- Ultra long lifespan light source, with a bulb lifespan of up to 10000 hours;
- Measure the diameter of the light spot to be 10mm, with a reflectivity accuracy of 0.05%;
- The software is easy to operate and responds in milliseconds.
Overview of Technical Parameters
| model |
wavelength range |
sample size |
Reflectance range |
Single point measurement time |
Measurement Mode |
| RT3000-UV |
230–1100nm |
230mm×230mm / 230mm×230mm |
0–100% |
1 second |
Dual path integrating sphere |
| RT3000-VIS |
400–1000nm |
230mm×230mm / 230mm×230mm |
0–100% |
1 second |
Dual path integrating sphere |
| RT3000-NIR |
400–2500nm |
230mm×230mm / 230mm×230mm |
0–100% |
1 second |
Dual path integrating sphere |
Configuration Instructions
- Host: Standard 8-degree angle integral reflectometer;
- Software: RT3000 operating software;
- Calibration board: Standard whiteboard, data can be traced back to the Chinese Academy of Metrology.
