Product Core Information
- Product Name: Fully Automatic Standard 8-Degree Angle Reflectometer (RT3000-STM Series)
- Applicable standards: ISO7724, DIN5033
- Main functions: Supports fully automatic two-dimensional scanning (MAPPING), automatic positioning, automatic calculation of multi-point average/maximum/minimum reflectivity, chromaticity value (RGB/XYZ/LAB) measurement, millisecond level rapid testing
- Technical advantages: non-contact design of integrating sphere, ultra long lifespan light source, reasonable structure and easy maintenance, easy software operation
- Application areas: Reflectance testing in the solar photovoltaic industry, covering processes such as polishing wafers, acid/alkali velvet wafers, PECVD coating, etc
Overview of Technical Parameters
| model |
wavelength range |
sample size |
Reflectance range |
precision |
Single point measurement time |
Fully automatic 2D scanning |
color measurement |
Measure the diameter of the light spot |
Measurement Mode |
Integral sphere reflectance |
Lamp lifespan |
measurement standard |
| RT3000-UV-STM |
230-1100nm |
230×230mm / 230×230mm |
0-100% |
0.05% |
1 second |
Support automatic positioning at any point |
Support |
10mm |
Dual path integrating sphere |
99% |
10000 hours |
ISO7724、DIN5033 |
| RT3000-VIS-STM |
400-1100nm |
230×230mm / 230×230mm |
0-100% |
0.05% |
1 second |
Support automatic positioning at any point |
Support |
10mm |
Dual path integrating sphere |
99% |
10000 hours |
ISO7724、DIN5033 |
| RT3000-NIR-STM |
400-2500nm |
230×230mm / 230×230mm |
0-100% |
0.05% |
1 second |
Support automatic positioning at any point |
Support |
10mm |
Dual path integrating sphere |
99% |
10000 hours |
ISO7724、DIN5033 |
Configuration Instructions
- Host: Standard 8-degree angle integral reflectometer
- Software: RT3000-STM operating software
- Calibration board: Standard whiteboard (data traceable to the Chinese Academy of Metrology)
- Workbench: Desktop Work Platform
- Computer: Industrial Control Computer
This device provides reflectance data support for the entire process of silicon wafer velvet production and coating in the photovoltaic industry through high-precision spectral detection, and is a key detection tool for improving the efficiency and yield of solar cells.
