Film thickness measuring instrument

The film thickness measuring instrument FILMTHICK-C10 utilizes the principle of optical interference and integrates an imported halogen tungsten lamp light source with a mechanical structure, with a service life of over 10000 hours. FILMTHICK performs non-contact, non-destructive, and high-precision measurements on samples, and can measure parameters such as reflectivity, color, and film thickness. Can be applied to thickness measurement of thin film layers in semiconductor thin films, liquid crystal displays, optical coatings, biomedical applications, and more. The OPTICA-FILMTEST optical film thickness measurement software adopts various high-precision algorithms such as FFT Fourier method, extremem method, and fitting method, including a rich material refractive index database and an open material database, effectively assisting users in testing and analysis. During the measurement period, it can display real-time trends such as interference, FFT spectra, and film thickness.