Brand and Title
JINGYI Jing Yi
Reflectance detector JY-F03
JING YI GUANG DIAN COMPANY
High stability of light source output and fast measurement speed
Guangzhou Jingyi Optoelectronics Technology Co., Ltd
Reflectance detector JY-F03
Product Introduction
The JY-F03 reflectance detector can measure the reflectance ratio and reflectance curve of various objects, and analyze the color characteristics of substances to achieve rapid detection of full spectrum reflectance simultaneously.
Meet various national standards. Adopting the integral sphere measurement method, the measurement angle can be customized according to needs, and the light source output has high stability and fast measurement speed, achieving real-time measurement operation.
Second (Product Features&Application Fields)
Product Features
Integrated measurement, intelligent operation
Wide spectrum detection 380-1000NM, 900-1650NM
Stable measurement data with high accuracy
Equipped with an embedded computer, easy to operate
The measurement speed is extremely fast, and data can be obtained within milliseconds
Third party authoritative certification, capable of issuing measurement certificates
Independent research and development, patented products
Support XY chromaticity diagram, L · A · B measurement, and can determine object color based on spectral reflectance using spectrophotometry
Customizable industrial online automatic detection solution
Customized solutions can be made according to specific needs
Application Fields
Reflectivity detection of mobile phone cover, tablet back cover, etc
Reflectance detection of lampshades, reflective cups, car rearview mirrors, etc
Measurement of reflectance spectra and color sorting of coatings, pigments, inks, plastics, etc
Spectral measurement of reflectivity of metal objects such as copper sheets
Spectral measurement of reflectance of ore powder
Measurement of Reflectivity of Opaque Thin Films
Reflectance detection of optical components
Solar silicon wafer reflectivity detection
Fabric measurement
Identification of Jewelry, Jadeite, and Diamonds
Reflectance detection of solid samples
Third (Application Cases&Product Parameters)
Application Cases
- Measurement of silicon wafer reflectivity
- Fabric measurement
- Coating measurement
- Measurement of Reflectance of Iron Ore Powder
- Ink measurement
- Measurement of Reflectivity of Copper Sheet Metal
Product Specifications
| project |
parameter |
| model |
JY-F03 |
| Measurement function |
Reflectance/Reflectance Spectral Curve/Color |
| Lighting reception conditions |
Reflection: 8-degree illumination/vertical reception (integrating sphere method) |
| wavelength range |
380-1000NM、900-1650NM |
| Sample mouth size |
9MM (customizable according to requirements) |
| measurement range |
reflectance：0-100% |
| detector |
2048 array photodetector |
| Single sampling time |
Better than 1S |
| Wavelength accuracy |
<1NM |
| Wavelength repeatability |
0.2NM |
| display precision |
0.01% |
| Instrument repeatability |
<1% |
| Deducting dark background |
Automatic |
| Minimum size of measurable sample shape |
>9MMM (customizable according to requirements) |
| Maximum size of measurable sample shape |
Any size |
| Measurable parameters |
Wavelength reflectance, average reflectance, reflectance spectral curve, reflectance over time curve, reflectance color XY, XYZ, LAB |
| Computer operating system |
USB port |
| Supporting operating systems |
WINDOWS98/2000/XP/VISTA/WINDOWS7/8/10 |
| warranty |
3 years |
Product Dimensions
- Length: 60CM
- Width: 32CM
- Height: 24CM
Fourth (Product Advantages)
Advantage 1
Reflectance integrated device with built-in display computer, capable of measuring reflectance spectra, easy and fast operation, and quick display of measured spectral data on the computer.
Advantage 2
The light source has stable output, strong energy, high measurement repeatability, and accurate data.
Advantage Three
This product adheres to the principle of independent innovation, and has applied for multiple patented technologies and software copyright certificates.
- Patent: Utility model name: Full spectrum reflectance rapid detector, a reflectance detector; Patentee: Guangzhou Jingyi Optoelectronics Technology Co., Ltd
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- Software Copyright: Computer Software Copyright Registration Certificate
Advantage Four
This product adheres to innovation and quality as the foundation, and has the characteristics of accurate, comprehensive, fast, convenient, and wide application range of measurement results. It has been awarded the qualification certificate of high-tech products.
Advantage 5
This product can also perform CIE color detection on samples, calculating various CIE color parameters of the sample, such as X, Y, L, A, B, dominant wavelength, etc.
Advantage Six
Quality inspection can be carried out by setting upper and lower limits for any wavelength range, quickly determining whether the product measurement results are OK or NG, automatically sorting out non-conforming products, and statistical analysis of product yield.
