Analysis of Jingyi Optoelectronic Fully Automatic Film Thickness Measuring Instrument CT18
Fully automatic film thickness measuring instrument
jy-filmthick-ct18
Complex modeling analysis with nanometer level high precision
Precision Spectral Interference Thickness Measurement Method with Film Thickness Analysis Algorithm
Kilohertz spectral sampling rate
Product Introduction
Jingyi Optoelectronics' fully automatic film thickness measuring instrument JY-filmhick-CT18 utilizes the principle of optical interference to design a highly stable testing platform with a bridge mounted detection head structure and a super large stroke on the xy axis. It can measure large-sized samples of 1.2x0.7m with one click testing output and automatic positioning for non-contact, non-destructive, high-precision multi-point measurement of samples. It can be applied to thickness measurement of thin film layers in semiconductor thin films, liquid crystal displays, optical coatings, biomedical applications, and other fields.
The opticafilmtest optical film thickness measurement software adopts various high-precision algorithms such as FFT Fourier method, extremum method, and fitting method. It can set hundreds of test points to measure parameters such as sample reflectivity, color, and film thickness. It also includes a rich material refractive index database and an open material database, effectively assisting users in testing and analysis. During the measurement period, it can display real-time trends such as interference, FFT spectra, and film thickness.
Application Fields
Coverage industry
High precision film thickness measurement case
Semiconductor
Silicon semiconductor, silicon carbide semiconductor, gallium arsenide semiconductor, photoresist, oxide/nitride process thin film, dielectric material, silicon or other semiconductor film layer
LCD (Liquid Crystal Display)
oled、 Glass thickness, polyimide, LCD TFT, ITO and other TCO
Optical coating
HC hard coating, AR anti reflection layer, AG anti glare coating, filter glasses
Biomedicine
Parylene, polymers, biofilms, medical devices
thin film
AR membrane, HC membrane, PET membrane
industry case
Fluoroplastic film thickness: 162um
Thickness of photoresist: 72nm
Parylene thickness: 2496nm
ITO film indium tin oxide thickness: 36nm
SiO2 silicon wafer thickness: 2108nm
Perovskite thickness: 16.7nm
Quantum dot thickness: 38.3nm
Pi film thickness: 30628nm
Polyurethane thickness: 26480nm
HC hardening layer thickness: 52360nm
Microfluidic coating thickness: 3012nm
PDMS film polydimethylsiloxane thickness: 10.8nm
Product Features
One click output for automatic positioning and multi-point testing
Using high-intensity deuterium tungsten lamp light source, the spectrum covers the deep ultraviolet to near-infrared range
Based on the principle of coherence of reflected light between the upper and lower interfaces of the thin film layer, it is easy to analyze the thickness of the film layer
Configure powerful core analysis algorithms: FFT analysis for thick films, curve fitting analysis for analyzing the physical parameter information of thin films
Curve fitting analysis method for analyzing thin films
FFT (Fast Fourier Transform) analysis of thick films
Extreme value analysis method
Cooperative Clients
Technical Parameters
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project
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parameter
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model
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jy-filmthick-ct18
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Wavelength range for film thickness measurement
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400nm-1000nm
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Film thickness detection range
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1μm-250μm
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measurement accuracy
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0.2%
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Spot size
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Diameter 3mm
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Maximum sample size
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1200x700mm
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Single test time
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Better than 1 second
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Film thickness measurement method
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Single point automatic positioning detection
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Number of testing points
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Up to 200 test points can be set
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Moving axis
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XY axis movement
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Measurable parameters
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Reflectivity, film thickness, color
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Report data
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Can output test data files for different regions of the sample
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automatic judgment
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Customizable testing and judgment conditions, automatically determining whether it is OK or NG
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positioning accuracy
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0.05mm
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Display
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Embedded industrial grade tablet computer
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Optional customization function
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Transmittance, refractive index, etc
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